发明名称 PERFORMANCE BOARD FOR SEMICONDUCTOR TESTER AND SEMICONDUCTOR TESTER WITH THE BOARD
摘要 <p>PROBLEM TO BE SOLVED: To provide a performance board for improving reliability in data and reducing the damages of a tester as much as possible in an electrical die sorting(EDS) process by accurately supporting the performance board in a horizontal state. SOLUTION: A performance board 20 includes an upper board 24 mounted on a tester unit 20 for generating an electrical signal, an lower board 26 put in contact with a prober for feeding the electrical signal to the prober, and a joining unit 28 for joining the upper board 24 and the lower board 26 and having a means for moving the lower board with respect to the upper board. Then, the performance board 20 is held accurately in a horizontal state, and reliability of data is improved, and damages on the tester is reduced as much as possible in an electrical die sorting(EDS) process.</p>
申请公布号 JPH11145220(A) 申请公布日期 1999.05.28
申请号 JP19980189970 申请日期 1998.07.06
申请人 SAMSUNG ELECTRON CO LTD 发明人 JUNG YUI-KUN
分类号 G01R31/28;G01R31/26;H01L21/66;(IPC1-7):H01L21/66 主分类号 G01R31/28
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