SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE WITH FAULT DETECTING FUNCTION

摘要

A logic function block having an output signal potential sensing function is substituted for each of logic function blocks of which fault conditions cannot be detected on the basis of predetermined input/output signal combinations for determining whether or not the semiconductor integrated circuit device operates correctly. Probe lines and sense lines are connected only to the logic function blocks having output signal potential sensing function. The probe lines are driven from a probe line driver, and a sense line receiver reads out signals on the sense lines. Thus, without reducing fault detecting efficiency, the areas of an active region and a wiring region required for forming a fault detecting arrangement can be reduced.