发明名称 HIGH-FREQUENCY MEASUREMENT CONNECTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To measure the characteristic of a microstrip line by the simple operation regardless of a size of a substrate by mounting a connector having a conductor to be kept into contact with a strip conductor of the substrate which is mounted on a main body and is held by the first and second holding members. SOLUTION: A substrate holding face of a first holding member 22 is brought into contact with a conductor formation face of a substrate 1, and a central conductor 31 of a connector built into the first holding member 22, is brought into contact with an edge part of a strip conductor formed on an edge part of the substrate 1. Then two feed screws 27 are rotated to move a second holding member 23 in a direction to be close to the first holding member 22, and a substrate holding face of the moving second holding member 23 is brought into contact with an earthing plate 3 mounted on the other face of the substrate 1 to press the same. That is, the substrate 1 is held under a condition that an interval between the first holding member 22 and the second holding member 23 is adjusted by an interval adjusting mechanism 24. In this condition, the information is fetched from the strip conductor 2 formed on the substrate 1, and the characteristic of the microstrip line A is measured.
申请公布号 JPH11118863(A) 申请公布日期 1999.04.30
申请号 JP19970285023 申请日期 1997.10.17
申请人 MITSUBISHI HEAVY IND LTD 发明人 YOKOTA MASARU
分类号 G01R27/04;G01R31/00;H01P5/08 主分类号 G01R27/04
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