发明名称 METHOD FOR JUDGING ABNORMALITY AND LIFE OF SENSOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To detect the abnormality and the life of a sensor element by monitoring the change of an internal impedance of the gas sensor element and comparing with a preliminarily determined value. SOLUTION: When an abnormality judgment operation starts at a start time or at a regular or irregular confirmation time, an operation CPU 4 switches a switch 2 to B to connect an output of a gas sensor element to an internal impedance measurement circuit 5. The circuit 5 measures an internal impedance seen from an output terminal of the element 1 and sends the result to the CPU 4. A predetermined time later, the CPU 4 compares the internal impedance value of the element 1 with a plurality of preliminarily determined, abnormality judgment threshold values on the basis of a map stored therein beforehand, and judges the abnormality of the element 1. When the element 1 is judged as abnormal, the fact is displayed at a display part. When the element 1 is not judged to be abnormal or to be expired the judgment operation is terminated and the switch 2 is switched to A to enter a normal operation. A judgment condition for deterioration and life of the element is set so as to judge it as abnormal and expiration of the life when the impedance exceeds a threshold value or 0 Ω.
申请公布号 JPH11108878(A) 申请公布日期 1999.04.23
申请号 JP19970265501 申请日期 1997.09.30
申请人 AKEBONO BRAKE RES & DEV CENTER LTD 发明人 KANEKO MINORU
分类号 G01N27/409;F02D41/14;G01N27/26;G01N27/416;G01N27/417;G01N33/00 主分类号 G01N27/409
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