发明名称 Inline disk tester
摘要 The present invention is an inline tester for analyzing the integrity of a disk drive. Structurally, the inline tester includes a set of statistical and diagnostic routines included in the ROM of a disk drive and a diagnostic logic section included in the drive's logic board. In initial use, the inline tester reconfigures the drive, making the drive less tolerant of flaws within the drive's media. The drive is also reconfigured to enable error detection and disable error correcting codes as well as device retries. Each sector of the media is then tested with multiple test patterns and failing sectors are added to a list of suspected sectors. At the conclusion of testing, the drive is restored to its normal operating configuration with error correcting codes and device retries enabled. Later, each sector in the list of suspected sectors is re-tested. Sectors that fail are added to the drive's list of bad sectors and are replaced by an alternate sector allocated from a reserved portion of the drive.
申请公布号 US5895438(A) 申请公布日期 1999.04.20
申请号 US19960771985 申请日期 1996.12.23
申请人 HITACHI COMPUTER PRODUCTS (AMERICA ), INC. 发明人 YOMTOUBIAN, RUBEN
分类号 G11B20/18;(IPC1-7):G06F11/00 主分类号 G11B20/18
代理机构 代理人
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