发明名称 Method to measure deformation or vibration using electronic speckle pattern interferometry
摘要 The method involve illuminating the test item (1) with diffused coherent wave fields (2,3). These are produced by splitting (4) an unexpanded almost parallel or slightly convergent laser beam (5). The diffusers may be made of translucent material (6) or reflecting material (7). A video camera and image processing unit (8) monitors the behavior of the test item using a phase step or speckle correlation method. An Independent claim is included for an arrangement for measuring deformation or vibration.
申请公布号 DE19736169(A1) 申请公布日期 1999.04.15
申请号 DE19971036169 申请日期 1997.08.20
申请人 FHU HOCHSCHULE FUER TECHNIK, 89075 ULM, DE 发明人 LAU, BERNHARD, PROF. DR., 89275 ELCHINGEN, DE;PETROV, VALERY, DIPL.-ING., 89075 ULM, DE
分类号 G01B11/16;G01H9/00;(IPC1-7):G01B11/16;G01J9/02;G02B27/48 主分类号 G01B11/16
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