发明名称 |
Edge structure for semiconductor component e.g. diode |
摘要 |
The edge structure has at least two electrodes (A,K) lying opposite each other on two opposing sides of a semiconductor body (1,2). At least on pn transition (3,2) is provided in a middle region of the semiconductor component surrounded by the edge region and between the two electrodes. The structure also has an insulating layer (6) or a junction termination zone which extends between the middle region and the edge region from a side of the semiconductor body towards the other side, to a depth in the region of the charge carrier diffusion length. Field rings (4,5) may be provided in the edge region. Alternatively a zone with lateral variation in the doping may be provided in the edge region. Alternatively a weakly doped zone e.g. of silicon oxide or silicon nitride may be provided in the edge region.
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申请公布号 |
DE19741970(A1) |
申请公布日期 |
1999.04.01 |
申请号 |
DE19971041970 |
申请日期 |
1997.09.23 |
申请人 |
SIEMENS AG, 80333 MUENCHEN, DE |
发明人 |
BRUNNER, HEINRICH, DR., 84405 DORFEN, DE |
分类号 |
H01L29/06;H01L29/861;(IPC1-7):H01L29/861;H01L29/74 |
主分类号 |
H01L29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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