Test circuit for integrated circuit on same chip

摘要

The test circuit has a data writer for delivery of M-bit data that are split into N and written to a memory. From it the N of the M-bit data are read-out by a function director. One N is transmitted to an input/output terminal, and the M-bit data are compared with a prepared, expected M-bit value. The comparison result is determined and a coupled wide data bus transmits the N between the data writer, memory, and function director