PATTERN GENERATOR FOR SEMICONDUCTOR TEST DEVICE,申请号JP19970224535-传众专利搜索

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发明名称	PATTERN GENERATOR FOR SEMICONDUCTOR TEST DEVICE
摘要
申请公布号	JPH1164469(A)	申请公布日期	1999.03.05
申请号	JP19970224535	申请日期	1997.08.21
申请人	ADVANTEST CORP	发明人	GOISHI MASARU
分类号	G01R31/3183;(IPC1-7):G01R31/318	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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