| 摘要 |
PROBLEM TO BE SOLVED: To shorten the time required for transferring a test pattern data by shortening the means code length of one test pattern in comparison with a conventional coding method. SOLUTION: The integrated circuit tester comprises a data transfer unit 203 for transferring a test pattern data from an auxiliary memory 201 to a test pattern memory 204, and a data compression unit 202 for encoding the test pattern data based on the generation probability for each type of test pattern and compressing the test pattern data. |
