发明名称 |
Capacitor production in a transistor-containing semiconductor component especially a DRAM |
摘要 |
A capacitor is produced in a semiconductor component comprising a semiconductor substrate provided with a transistor by (a) producing a via plug electrically connected to an impurity region of the transistor; (b) producing a Si-H bonding layer on the plug surface; (c) removing H ions from the bonding layer to form a SiOx layer; and (d) producing an electrode above the plug. Independent claims are also included for similar processes involving carrying out, prior to step (a), a step of forming and selectively removing an insulating layer to form a via exposing a transistor impurity region, optionally before and after forming a bit line on the insulating layer including the via. Preferred Feature: The Si-H bonding layer is produced by dipping the substrate in an aqueous HF solution and the H ions are removed by heat treatment at 420-600 deg C and less than 10<-6> Torr.
|
申请公布号 |
DE19824774(A1) |
申请公布日期 |
1999.02.25 |
申请号 |
DE19981024774 |
申请日期 |
1998.06.03 |
申请人 |
LG SEMICON CO., LTD., CHEONGJU, KR |
发明人 |
YANG, DOO YOUNG, CHEONGJU, KR |
分类号 |
H01L27/108;H01L21/02;H01L21/28;H01L21/768;H01L21/8242;H01L21/8246;H01L27/105;(IPC1-7):H01L21/824 |
主分类号 |
H01L27/108 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|