发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To improve the increase rate of the surface area on a film formed on a wafer. SOLUTION: The method is to grow hemispherical or mushroom-like fine crystal grains on the surface of a silicon film by an annealing processing. When the fine crystal grains are formed to desired sizes, gas for inhibiting the surface migration of silicon atoms is added and grain growth is simultaneously stopped. Thus, the size and the form of a fine crystal nucleus on the surface of the silicon film can be controlled and the grains of forms optimum for the device are obtained.
申请公布号 JPH1140763(A) 申请公布日期 1999.02.12
申请号 JP19970190044 申请日期 1997.07.15
申请人 NEC CORP 发明人 WATANABE HIROHITO
分类号 H01L27/04;H01L21/02;H01L21/205;H01L21/822;H01L21/8242;H01L27/108 主分类号 H01L27/04
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