发明名称 ELECTRODE ON N-TYPE NITRIDE SEMICONDUCTOR SEMICONDUCTOR DEVICE PROVIDED WITH IT, AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To dispense with a high-temperature heat treatment and to obtain an electrode which comes into ohmic contact with an n-type nitride compound semiconductor by a method, wherein an aluminum layer is provided in the n-type nitride compound semiconductor, and a gold layer is laminated thereon through the intermediary of a silicon layer or a nickel layer. SOLUTION: An n-type GaN film 2 is formed on a sapphire substrate 1, and an electrode 15 of multilayered film is formed. Four kinds of the n-type electrodes 15 of multilayered film are formed through an electron beam vapor deposition method at a room temperature. First, aluminum is vapor deposited on the n-type GaN film 2, and then gold is laminated, and second, aluminum is vapor deposited on the n-type GaN film 2. The silicon is provided, and then gold is laminated, and third aluminum is vapor deposited on the n-type GaN film 2. Nickel is provided thereon, then gold is laminated thereon, and fourth aluminum is vapor deposited on the n-type GaN film 2, silicon and nickel are successively laminated, and then gold is laminated thereon. Through this setup, an electrode coming into ohmic contact with a gallium nitride semiconductor can be obtained which dispenses with a high-temperature heat treatment.
申请公布号 JPH1140852(A) 申请公布日期 1999.02.12
申请号 JP19970190947 申请日期 1997.07.16
申请人 SANYO ELECTRIC CO LTD 发明人 TAKEUCHI KUNIO;HAYASHI NOBUHIKO;NOMURA YASUHIKO;TOMINAGA KOJI
分类号 H01L21/285;H01L29/45;H01L33/32;H01L33/38;H01L33/40;H01S5/00;H01S5/042;H01S5/323 主分类号 H01L21/285
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