发明名称 PICK AND PLACE DEVICE FOR HANDLER SYSTEM FOR SEMICONDUCTOR DEVICE TEST
摘要 <p>PROBLEM TO BE SOLVED: To provide a pick and place device for a semiconductor device testing handler system which carrys out the precise orientation of a semiconductor device during the movement of the semiconductor device from a customer tray to a test tray for shortening a tack time. SOLUTION: A pick and place device has a frame 104; a movable plate 114 provided in the frame 104; a first cylinder 107 for elevating the movable plate 114; the many second cylinders 112 elevated according to the ascent and descent of the movable plate 114; many vacuum adsorber 111 for picking up a tested semiconductor device 109 housed in a customer tray 110; a lining up means for lining up the vacuum adsorber 111 for the precise orientation of the semiconductor device picked up by the vacuum adsorber; and an orienting means for orienting said semiconductor device which is lined up by said lining up means and separated from the vacuum adsorber 111.</p>
申请公布号 JPH115629(A) 申请公布日期 1999.01.12
申请号 JP19980084196 申请日期 1998.03.30
申请人 SAMSUNG ELECTRON CO LTD 发明人 GU TAIKO
分类号 G01R31/26;B25J15/06;B65G49/07;H01L21/66;H01L21/68;(IPC1-7):B65G49/07 主分类号 G01R31/26
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