发明名称 |
PICK AND PLACE DEVICE FOR HANDLER SYSTEM FOR SEMICONDUCTOR DEVICE TEST |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a pick and place device for a semiconductor device testing handler system which carrys out the precise orientation of a semiconductor device during the movement of the semiconductor device from a customer tray to a test tray for shortening a tack time. SOLUTION: A pick and place device has a frame 104; a movable plate 114 provided in the frame 104; a first cylinder 107 for elevating the movable plate 114; the many second cylinders 112 elevated according to the ascent and descent of the movable plate 114; many vacuum adsorber 111 for picking up a tested semiconductor device 109 housed in a customer tray 110; a lining up means for lining up the vacuum adsorber 111 for the precise orientation of the semiconductor device picked up by the vacuum adsorber; and an orienting means for orienting said semiconductor device which is lined up by said lining up means and separated from the vacuum adsorber 111.</p> |
申请公布号 |
JPH115629(A) |
申请公布日期 |
1999.01.12 |
申请号 |
JP19980084196 |
申请日期 |
1998.03.30 |
申请人 |
SAMSUNG ELECTRON CO LTD |
发明人 |
GU TAIKO |
分类号 |
G01R31/26;B25J15/06;B65G49/07;H01L21/66;H01L21/68;(IPC1-7):B65G49/07 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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