发明名称 |
Insulation groove manufacturing method for direct wafer bond substrate |
摘要 |
The manufacturing method involves forming a lateral insulation groove (4) in a silicon/silicon dioxide/silicon substrate, provided by a crystalline silicon disc (1), a silicon dioxide dielectric insulation layer (2) and an on-type crystalline silicon layer (3). The latter layer is etched and the etched groove is fitted with a highly doped p-type polysilicon (5). The highly doped polysilicon is diffused into the sidewalls (6) of the groove, to provide diffusion regions (7) of opposite conductivity type. The silicon layer has a (110) crystal orientation and the isolation wet etched.
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申请公布号 |
DE19728282(A1) |
申请公布日期 |
1999.01.07 |
申请号 |
DE19971028282 |
申请日期 |
1997.07.02 |
申请人 |
SIEMENS AG, 80333 MUENCHEN, DE |
发明人 |
TIHANYI, JENOE, DR.-ING., 85551 KIRCHHEIM, DE |
分类号 |
H01L21/762;H01L21/84;(IPC1-7):H01L21/76;H01L21/86 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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