发明名称 Opto-electronic measuring apparatus for checking linear dimensions
摘要 PCT No. PCT/EP96/01444 Sec. 371 Date Oct. 7, 1997 Sec. 102(e) Date Oct. 7, 1997 PCT Filed Apr. 2, 1996 PCT Pub. No. WO96/32624 PCT Pub. Date Oct. 17, 1996An apparatus for checking linear dimensions of a workpiece (10) according to the shadow casting technique, including a bed (1), a first support structure (5, 6) sustained by the bed for supporting the workpiece, a second support structure (4), optical sources (22-25) coupled to the second support structure (4) for generating associated beams of light, a plurality of linear photosensitive devices (26-29) coupled to the second support structure (4) for receiving the beams of light after they have been intercepted by the workpiece, and detecting circuits (20, 21) connected to the photosensitive devices (26-29). The optical sources (22-25) are arranged in two units (22, 23; 24, 25) at opposite sides with respect to the workpiece, and the photosensitive devices (26-29) are also arranged in two units (26, 27; 28, 29) located at opposite sides with respect to the workpiece. Two optical beam splitters (30, 31) coupled to the second support structure (4) partially reflect the beams of light emitted by the optical sources and generate two sections of beams of light directed in opposite directions, that fall on the workpiece and reach the photosensitive devices (26-29). The photosensitive devices are substantially arranged in a same transversal plane.
申请公布号 US5841542(A) 申请公布日期 1998.11.24
申请号 US19970930761 申请日期 1997.10.07
申请人 MARPOSS SOCIETA' PER AZIONI 发明人 MILANA, EMILIO;GRAZIANI, GIOVANNI
分类号 G01B11/02;G01B11/245;(IPC1-7):G01B11/08 主分类号 G01B11/02
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