发明名称 |
Fast testing of D/A converters |
摘要 |
Testing of digital-to-analog converters is accelerated by applying one or more different approaches. One approach relies on a switched capacitor, which lowers the overall capacitance of the converter during testing, thereby reducing the settling time for each code value. Another approach makes the duration of each testing step a function of the particular code value, rather than using the worst-case settling time for each testing step. Yet another approach uses a sequence of non-consecutive code values to determine whether each switch in the converter is functional. Using non-consecutive code values permits the use of partial settling times during converter testing. Each of the approaches can be used to accelerate the testing of D/A converters, whether they have linear or folded resistor strings.
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申请公布号 |
US5841382(A) |
申请公布日期 |
1998.11.24 |
申请号 |
US19970820819 |
申请日期 |
1997.03.19 |
申请人 |
LUCENT TECHNOLOGIES INC. |
发明人 |
WALDEN, ROBERT W.;KHOINI-POORFARD, RAMIN;BURCHANOWSKI, WILLIAM E. |
分类号 |
H03M1/10;H03M1/68;H03M1/76;(IPC1-7):H03M1/10 |
主分类号 |
H03M1/10 |
代理机构 |
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