发明名称 Manufacturing method of transistors
摘要 A manufacturing method for transistors wherein silicide is directed doped with a conductive impurity includes the steps of: forming a field oxide film defining an active region on a semiconductor substrate; forming transistors wherein a doped first silicide film is formed on gate electrodes on said active region; forming an interlayer dielectric film having contact holes on the whole surface of said semiconductor substrate; forming spacers on the innerwalls of each contact hole;p forming a thin doped polysilicon film on the whole surface of said semiconductor surface; and forming a doped second silicide film on the whole surface of said doped polysilicon film, filling each contact hole. The silicide film is directly doped with conductive impurity so that the conductive impurity of a polysilicon film can be prevented from being diffused to the outside. Therefore, the doped silicide film is useful to prevent the threshold voltage from increasing and the saturation current from reducing.
申请公布号 US5837605(A) 申请公布日期 1998.11.17
申请号 US19950563082 申请日期 1995.11.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, YOUNG-WOOK;BAE, DAE-ROK;PARK, MUN-HAN
分类号 H01L21/28;H01L21/285;H01L21/336;H01L29/78;(IPC1-7):H01L21/441 主分类号 H01L21/28
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