发明名称 SCANNING ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To improve the accuracy of the alignment of primary electron beam by interlocking modulation amplitude control of the exciting current of an objective lens for alignment with an image magnification, a focus current, and an accelerating voltage and expressing these parameters with a preset product. SOLUTION: When primary electrons are aligned with an objective lens, an observation magnification M when a focus position Z is constant, and an appropriate modulation amplitude of the objective lens in Z in a case of setting M to a fixed value are expressed by an exponential function with M as the base, F2 =M<b> and an exponential function with Z as the base, F1 =Z<a> respectively. The modulation amplitude of the appropriate objective lens in changing M and Z is expressed by the product of F1 by F2 and the focus characteristics of the objective lens is a value obtained by dividing a lens current Iobj by a square root√Vacc , of the accelerating voltage, and Z is calculated from Iobj /√Vacc . The modulation amplitude of the exciting current of the objective lens is controlled based on these relations so that highly precise alignment can be implemented.
申请公布号 JPH10289680(A) 申请公布日期 1998.10.27
申请号 JP19970095569 申请日期 1997.04.14
申请人 HITACHI LTD 发明人 HOYA TAKASHI;SATO MITSUGI
分类号 H01J37/04;H01J37/21;(IPC1-7):H01J37/21 主分类号 H01J37/04
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