发明名称 FIGURE PATTERN GENERATING EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To generate inspection reference data of high precision at a high speed, by installing a preliminary expansion means which extracts information of an element figure together with two bit pattern expansion means different in quantizing dimension, and a figure data distributing means which distributes the outputs of the preliminary expansion means in two bit patterns. SOLUTION: A part corresponding to a pattern is scanned in the course of observation, to obtain a pattern to be inspected, and the pattern is fetched in data memories 31-33 in a bit pattern generating circuit 13 by a means like DMA transfer. Quantization dimension of one picture element at the time of expansion by bit pattern expansion circuit 35, 38 is given in advance to a preliminary expansion circuit 34 precedent to the first and the second bit pattern expansion circuits 35, 38 from a computer 10. The preliminary expansion circuit 34 reads a bank of the data memory corresponding to a stripe in the course of inspection, out of the data memories 31-33, extracts figure data to be processed, and deciphers them. Then, an element figure is distributed most suitably in the bit patterns 35, 38 by a figure data distributed circuit 41.
申请公布号 JPH10284383(A) 申请公布日期 1998.10.23
申请号 JP19970089369 申请日期 1997.04.08
申请人 TOSHIBA CORP 发明人 TSUCHIYA HIDEO
分类号 G03F1/84;H01L21/027;H01L21/66 主分类号 G03F1/84
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