发明名称 Multistation surface inspection system
摘要 An inspection system and an inspection method, the method including detecting flaws on a surface, determining the size, count, and position of flaws on the surface, providing a representation of the detected flaws by size, count, and position on a display, setting a display threshold value which is a function of a number of particles of a particular size to be displayed on the display, determining when the display threshold is breached and in response adjusting the display to cease displaying those flaws, storing at least one inspection threshold value, and determining when the inspection threshold value is breached and in response outputting an inspection interrupt signal to stop the inspection after the inspection threshold value is breached.
申请公布号 US5814829(A) 申请公布日期 1998.09.29
申请号 US19950500768 申请日期 1995.07.11
申请人 QC OPTICS, INC. 发明人 BROUDE, SERGEY V.;ALLEN, NICHOLAS;BOUDOUR, ABDU;CHASE, ERIC;JOHNSON, CARL;MILLER, PASCAL;ORMSBY, JAY
分类号 G01N21/94;(IPC1-7):G01N21/88 主分类号 G01N21/94
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