发明名称 |
MANUFACTURE OF SEMICONDUCTOR THIN FILM |
摘要 |
PROBLEM TO BE SOLVED: To efficiently dope a p-type impurity at a high cocn., without generating cracks by specifying a carrier gas for carrying a raw material gas to a reactor tube by holding down the surface for growing a p-type impurity-doped GaN compd. semiconductor film thereon. SOLUTION: In a reactor tube 1 a substrate holder 3 for holding a substrate 2 with its thin film-forming face down and substrate 2 are disposed and heated by a heater 4. An organometallic compd. raw material gas contg. Mg is gasified and taken out by bubbling a flow-rate-controlled subcarrier H gas fed in a cylinder involving the organometallic compd. and fed into the tube 1 efficiently with a flow-rate-controlled ammonia and carrier gas contg. flow-rate-controlled H 20% or less N mixed with H 20-20%. |
申请公布号 |
JPH10256167(A) |
申请公布日期 |
1998.09.25 |
申请号 |
JP19970062659 |
申请日期 |
1997.03.17 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
OKU YASUNARI;KAMEI HIDENORI;TAKEISHI HIDEMI |
分类号 |
H01L21/205;H01L33/32 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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