发明名称 Short wavelength projection optical system
摘要 A short wavelength reduction projection optical system used for transferring integrated circuit patterns from a reticle to a wafer in a semiconductor manufacturing system. The optical system has object side and image side virtually telecentric, high resolution over a wide exposure area, and adequately compensates for optical aberrations without increasing the length of the optical system. The optical system has a first group of lenses with weak refractive power, a second group of lenses with a positive refractive power, a third group of lenses with a negative refractive power, a fourth group of lenses with a positive refractive power, and an aperture stop located between the third and fourth groups of lenses.
申请公布号 US5808814(A) 申请公布日期 1998.09.15
申请号 US19960683288 申请日期 1996.07.18
申请人 NIKON CORPORATION 发明人 KUDO, SHINTARO
分类号 G02B11/28;G02B13/14;G02B13/24;G03F7/20;H01L21/027;(IPC1-7):G02B9/00;G02B9/60 主分类号 G02B11/28
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