发明名称 Method and apparatus for fabricating a metal interconnection pattern for an integrated circuit module
摘要 A method for fabricating a metal interconnection pattern for an integrated circuit module is provided comprising the steps of: aligning only one face of the module, forming a metal layer on at least one other face of the module, applying a coating of photoresist to the metal layer, exposing predetermined portions of the photoresist to reflected radiation, and shaping the metal layer in accordance with the exposed photoresist portions. <IMAGE>
申请公布号 EP0593199(B1) 申请公布日期 1998.09.09
申请号 EP19930307937 申请日期 1993.10.06
申请人 GENERAL ELECTRIC COMPANY 发明人 BALCH, ERNEST WAYNE;WEAVER, JR., STANTON EARL;KING, WILLIAM HAROLD;GOROWITZ, BERNARD
分类号 H01L21/60;H01L21/48;H01L23/12;H01L23/498;H05K3/00;H05K3/06;H05K3/34;H05K3/40 主分类号 H01L21/60
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