发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT ELEMENT AND ITS MOUNTING CONFIRMATION TEST METHOD
摘要 PROBLEM TO BE SOLVED: To perform a mounting confirmation test easily at low cost, with no function test pattern required for an in-circuit tester. SOLUTION: A semiconductor integrated circuit element 1 comprises a test signal-dedicated external terminal 4, a switch circuit 5, and a control signal external terminal 6. The operation of the switch circuit 5 is controlled with the control signal inputted from the control signal external terminal 6, and the switch circuit 5 controls continuity/non-continuity between a circuit operation signal external terminal 3 and the test signal-dedicated external terminal 4. With the circuit operation signal external terminal 3 and the test signal- dedicated external terminal 4 electrically connected together, a test signal is inputted from the test signal-dedicated external terminal 4, and with the test signal, the connection state between the circuit operation signal external terminal 3 and the terminal of a printed wiring board 7 is tested.
申请公布号 JPH10213633(A) 申请公布日期 1998.08.11
申请号 JP19970018265 申请日期 1997.01.31
申请人 MITSUBISHI ELECTRIC CORP 发明人 SUGANO YUKIO
分类号 G01R31/28;G01R31/3185;H01L21/66;H05K1/02;H05K1/11;H05K3/30;H05K13/08 主分类号 G01R31/28
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