| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory device which enables the accurate analysis of the states of word lines, bit lines or memory cells. SOLUTION: A sensing amplifier 3 and an equalizing circuit 4 are connected successively through a cut-off circuit 5 to a pair of complementary bit lines to which each memory cell 6a is connected. Further, a 1st outer terminal 1 through which an arbitrary signal is supplied to a word line selection circuit 8 and a 2nd outer terminal 2 through which an arbitrary signal is supplied to a bit line selection circuit 7 are provided. As the 1st outer terminal 1 and the 2nd outer terminal 2 are used while the cut-off circuit 5 is in an off state, the states of the word lines 10 in a test mode, the bit lines 9 or the memory cells 6a can be accurately analyzed. |
