发明名称 PROCESS TESTING PURITY OF MATERIAL OF CONDUCTIVE ARTICLE ( VERSIONS )
摘要 FIELD: study and analysis of materials with use of electric aids, test of inhomogeneity of conductive material over material thickness. SUBSTANCE: process is intended to test possible imitation of article in the form of bars of rare-earth or noble metals. Process is based on probing of skin layer of material by currents of various frequencies. Currents or voltages across examined section of article are found for each value of AC frequency. Determination of resistive characteristics of each layer of metal located at depth corresponding to values of two adjacent frequencies of specified range makes it possible to obtain information on disturbance of homogeneity of material in sublayer of material thinner than skin layer. EFFECT: improved efficiency of process. 6 dwge
申请公布号 RU2115934(C1) 申请公布日期 1998.07.20
申请号 RU19960124334 申请日期 1996.12.20
申请人 UKHANOV SERGEJ IVANOVICH 发明人 IVANOV V.V.;INKIN V.N.;UKHANOV S.I.;UKHANOV JU.I.
分类号 G01R27/14;G01N27/04;G01R27/00;G01R27/02;(IPC1-7):G01R27/14 主分类号 G01R27/14
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