Method for generating test pattern sets during a functional simulation and apparatus

摘要

A method and apparatus are disclosed for generating modular test pattern sets for production testing of a digital circuit. The method comprises the steps of enabling a pattern generator (16) and executing a functional simulation on a functional simulator (18) until a first time mark. The pattern generator (16) is disabled and the state of the registers in the digital circuit (52) are captured using scanning circuitry in the circuit (52). The captured state is stored in a memory (68) external to the digital circuit (52). The pattern generator (16) is then re-enabled and the registers are reloaded from the memory (68) using the scanning circuitry of the circuit (52). The functional simulation is resumed until a second time mark. Whenever the pattern generator (16) is enabled, a pattern is stored on a storage medium (20) in response to a clock controlling the circuit (52) wherein each pattern represents the electrical state of the inputs and outputs of the circuit (52) during a particular clock cycle.