发明名称 Inspection system and device manufacturing method using the same
摘要 An inspection system includes a light source, a scanning device for scanning a surface to be inspected, with light from the light source, wherein the scanning device includes an optical member disposed with inclination with respect to a primary scan direction, the optical member being adapted to provide a convergent light being converged to form a spot at a distance changeable with the position of a scan, and a light receiving device for receiving scattered light from the surface.
申请公布号 US5767962(A) 申请公布日期 1998.06.16
申请号 US19960755352 申请日期 1996.11.25
申请人 CANON KABUSHIKI KAISHA 发明人 SUZUKI, MASAYUKI;NOSE, NORIYUKI;YOSHII, MINORU;MIYAZAKI, KYOICHI;TSUJI, TOSHIHIKO;TAKEUCHI, SEIJI
分类号 G01N21/88;G01B11/30;G01N21/94;G01N21/956;G03F1/08;G03F1/84;H01L21/66;(IPC1-7):G01N21/00 主分类号 G01N21/88
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