发明名称 FRAME PATTERN GENERATION DEVICE FOR TEST SIGNAL
摘要 PROBLEM TO BE SOLVED: To enlarge a test range by incorporating frame system file and data file information into frames in outputting the respective frames constituting a test signal. SOLUTION: The respective areas of a plurality of data files 3, a circulating bit pattern memory 4 and a corresponding table 5a are formed in a first memory 1 and the respective areas of plural frame system files 6 and an address corresponding table 5b are formed in a second memory 2. A data file compiling part 7 writes data designated by a user into the respective data files 3. A frame system file compiling part 8 writes information for specifying necessary information in the data file 3 into the respective frame system files 6. A frame pattern generation part 9 reads the frame system files 6 for the respective frames 11 constituting the frame system 13 constituting the test signal, reads specified data from the data file 3 and a circular bit pattern memory 4, incorporates them, sequentially outputs them and displays and outputs the respective frames 11 on a display unit 10.
申请公布号 JPH10150430(A) 申请公布日期 1998.06.02
申请号 JP19960306292 申请日期 1996.11.18
申请人 ANRITSU CORP 发明人 ITAHARA HIROSHI
分类号 H04B17/00;H04B7/26;H04J13/00;H04J13/16;H04L29/14;H04W24/00;H04W24/06 主分类号 H04B17/00
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