| 摘要 |
<p>PROBLEM TO BE SOLVED: To directly monitor the setting values during normal operation by calculating prescribed setting values of respective modules from the frequency response of the respective modules measured by means of a frequency response measuring means. SOLUTION: The module 6 is not taken-out from a rack but sine wave is impressed on a process signal with an adder 5 instead and, then, the input/output of the module 6 at that time is measured by a measuring part 9. A frequency spectrum generating part 10 obtains a power spectrum by resolving respective frequencies for input/output data of the measured modules 6. A board diagram generating part 12 compares the power spectrums of respective inputs/outputs in the frequency of impressed sine wave so as to obtain the gain of the module 6 in the frequency and a phase. Then, while changing the frequency of impressed sine wave, this work is repeated so that the gain-frequency characteristics and the phase-frequency characteristic of the first delay module 6 are calculated.</p> |
