| 摘要 |
A laser measurement system for rapid calibration of machine tools includes a measurement enhancement device which enables an existing standard single degree of freedom laser interferometry system to simultaneously measure up to four additional degrees of freedom. The device includes a first beamsplitter (56) which splits a laser beam of the existing measurement system, such as return laser beam (58), into a first beam (60) for use by an existing component of the existing interferometry system, and a second beam (62) for use by the measurement enhancement device. The measurement enhancement device also includes a measurement component which simultaneously receives second beam (62) for determination of a measurement value for at least a second degree of freedom in response to second beam (62).
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