| 摘要 |
A self-booting test circuit is used in a semiconductor circuit to test an internal voltage of an integrated circuit. The test circuit is connected between a single input pin and single output pin to produce the internal voltage at the output pin in response to a high level voltage being applied to the input pin. The circuit includes two paths, one of which has a delay circuit used to increase the voltage level of a control signal used for gating the internal voltage to the output pin.
|
