发明名称 BALL GRID ARRAY SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To provide the BGA semiconductor device with good electric connection by taking the notice of a glass transfer temperature Tg in sealing resin, to suppress warp from occurring in a BGA(ball grid array) device. SOLUTION: A semiconductor chip 2 which is electrically connected with circuit wiring is loaded on a wiring substrate 1, having circuit wiring and a second sealing resin 5 the glass transfer temperature Tg of which is higher than the solder melting temperature of a solder bump 7 for suppressing the warp of the BGA semiconductor device is provided on a first sealing resin 4 sealing the semiconductor chip 2. The thermal expansion of first sealing resin 4 can be suppressed by second sealing resin 5 and the wiring substrate 1, which do not thermally expand much, even if the first sealing resin 4 attempts to thermally expand at the time of mounting the BGA semiconductor device on a mounting substrate 8.
申请公布号 JPH10112515(A) 申请公布日期 1998.04.28
申请号 JP19960264716 申请日期 1996.10.04
申请人 DENSO CORP 发明人 HARADA YOSHIHARU;GOTO TSUTOMU
分类号 H01L23/12;(IPC1-7):H01L23/12 主分类号 H01L23/12
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