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发明名称
IC TEST EQUIPMENT
摘要
申请公布号
JPH09178814(A)
申请公布日期
1997.07.11
申请号
JP19950334474
申请日期
1995.12.22
申请人
ADVANTEST CORP
发明人
OSHIMA MASANORI
分类号
G01R31/26;G01R31/28;(IPC1-7):G01R31/28
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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