发明名称 Exposure mask and method and apparatus for manufacturing the same
摘要 This invention provides an exposure mask including a translucent film formed on a light-transmitting substrate and having a mask pattern, and a stabilized region formed in the boundary between the light-transmitting substrate and the translucent film or on at least the surface of the translucent film to prevent variations in physical properties of the translucent film. In addition, this invention provides a method of manufacturing an exposure mask, including the steps of forming a translucent film on a light-transmitting substrate, forming a photosensitive resin film on the translucent film, forming a photosensitive resin pattern by exposing the photosensitive resin film to a radiation or a charged particle beam, removing an exposed portion of the translucent film by using the photosensitive resin pattern as a mask, removing the photosensitive resin pattern, and forming a stabilized region in the boundary between the light-transmitting substrate and the translucent film or on at least the surface of the translucent film before the step of forming the photo-sensitive resin film or after the step of forming the photosensitive resin pattern. Also, this invention provides an apparatus for manufacturing an exposure mask.
申请公布号 US5728494(A) 申请公布日期 1998.03.17
申请号 US19960730017 申请日期 1996.10.11
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KAWANO, KENJI;ITO, SHINICHI;HIGASHIKAWA, IWAO;ITOH, MASAMITSU;KAMO, TAKASHI;HAZAMA, HIROAKI;IWAMATSU, TAKAYUKI
分类号 G03F1/00;G03F1/14;(IPC1-7):G03F9/00 主分类号 G03F1/00
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