发明名称 METHOD AND APPARATUS FOR FORMING OXYNITRIDE FILM AND NITRIDE FILM, OXYNITRIDE FILM, NITRIDE FILM AND BASE MATERIAL
摘要 <p>Uniform oxynitride and nitride films can be formed by low-temperature and high-speed nitriding reaction not dependent on the nitriding time or nitriding temperature. A solid dielectric is provided on at least one of opposed surfaces of a pair of electrodes opposed to each other under a pressure of 300 (Torr) or higher, a nitrogen gas containing an oxide equal to or lower than 0.2% is introduced into a space between the pair of opposed electrodes, an electric field is applied to the nitrogen gas, and the resulting N 2 (2 nd p.s.) or N 2 (H.I.R) active species is brought into contact with an object to be processed to form an oxynitride film/nitride film on a surface of the object to be processed.</p>
申请公布号 EP1739732(A1) 申请公布日期 2007.01.03
申请号 EP20050727499 申请日期 2005.03.25
申请人 SEKISUI CHEMICAL CO., LTD. 发明人 FUJIMURA, NORIFUMI;HAYAKAWA, RYOMA;KITAHATA, HIROYA;UEHARA, TSUYOSHI;YARA, TAKUYA
分类号 H01L21/318;C23C8/24;C23C8/28;C23C8/36;H01J37/32;H01L21/31;H01L21/314 主分类号 H01L21/318
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