发明名称 |
Halbleitervorrichtung und Herstellungsverfahren |
摘要 |
A semiconductor device and the method of fabricating the semiconductor device include a semiconductor substrate (1) and a plurality of conductor films (2) formed on the substrate. Each of the conductor films (2) is made of aluminum alloy including at least one element selected from palladium and platinum and, more preferably, further including at least one element selected from lithium, beryllium, magnesium, manganese, iron, cobalt, nickel, copper, lanthanum, cerium, chrome, hafunium, zirconium, cadmium, titanium, tungsten, vanadium, tantalum, and niobitum, with a protective film (3) which includes oxide of the selected one of palladium and platinum being formed on the side wall of the conductor film (2). |
申请公布号 |
DE68928448(T2) |
申请公布日期 |
1998.03.12 |
申请号 |
DE1989628448T |
申请日期 |
1989.01.19 |
申请人 |
HITACHI, LTD., TOKIO/TOKYO, JP |
发明人 |
ONUKI, JIN, HITACHI-SHI, JP;KOUBUCHI, YASUSHI, HITACHI-SHI, JP;FUKADA, SHINICHI, HITACHI-SHI, JP;SHIOTA, KATUHIKO, NAKA-GUN IBARAKI-KEN, JP;MIYAZAKI, KUNIO, HITACHI-SHI, JP;ITAGAKI, TATSUO, NISHITAMA-GUN TOKYO, JP;TAKI, GENJI, HITACHI-SHI, JP |
分类号 |
H01L21/285;H01L21/3213;H01L21/768;H01L23/532;(IPC1-7):H01L23/48;H01L23/52 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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