发明名称 COMPOSITION FOR FORMATION OF INSULATING FILM, COATING LIQUID FOR FORMATION OF INSULATING FILM AND FORMATION METHOD OF INSULATING FILM FOR SEMICONDUCTOR DEVICE USING IT AS WELL AS SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To form an insulating film whose burying property and flatness are enhanced, whose permeability is reduced and whose degradation is reduced with reference to an oxygen plasma, by a method wherein a composition is provided with a structure wherein a plurality of phosphorus atoms of phosphonoimide whose main chain is specific are bridged by a specific siloxane bond. SOLUTION: A composition is constituted of a polymer provided with a structure wherein a plurality of phosphorus atoms of phosphonoimide whose main chain is expressed by Formula I are cross-linked by a siloxane bond which is expressed by Formula II. In Formula I, (n) represents an integer of 3 or higher, and Formula II expresses a composition such as dimethyldioxosilicon ((CH3 )2 Si(O-)2 ), monomethyltrioxosilicon ((CH3 )Si(O-)3 ) or tetraoxosilicon (Si(O-)4 ). Thereby, it is possible to form an insulating film whose burying property and flatness are excellent whose dielectric constant is small and whose degradation is small with reference to an oxygen plasma.
申请公布号 JPH1064895(A) 申请公布日期 1998.03.06
申请号 JP19960215679 申请日期 1996.08.15
申请人 KAWASAKI STEEL CORP 发明人 NAKANO TADASHI;MURA NAOMI
分类号 B05D5/12;B05D7/24;C08G79/02;H01L21/312;H01L21/316 主分类号 B05D5/12
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