发明名称 SUBSTRATE FOR SEMICONDUCTOR DEVICE AND ITS MANUFACTURE, AND SEMICONDUCTOR DEVICE, AND CARD TYPE MODULE, AND INFORMATION STORAGE DEVICE
摘要 PROBLEM TO BE SOLVED: To apply plating completely into a through hole so as to raise the reliability on wiring by providing hard gold plating at a terminal for external connection, inside a through hole, and in the first region of a terminal for chip connection, and providing soft gold plating in the second region of a terminal for chip connection. SOLUTION: A copper wiring pattern is made, and a part of the wiring on the chip mounting face of a substrate 1 is masked. At this time, a terminal for chip connection is masked, and a through hole 4 is not masked. Next, bright nickel plating and hard gold plating are performed sequentially and the wiring pattern is plated with hard gold. Next, after removal of the mask, the section 3 plated with hard gold is masked. Next, mat nickel plating and hard plating are performed in order, and soft gold plating is applied to the section not covered with a mask. Then, this mask is removed. As a result, soft gold plating 3 is applied to the terminal for chip connection on the semiconductor chip mounting face and the wiring in its periphery.
申请公布号 JPH1056094(A) 申请公布日期 1998.02.24
申请号 JP19970140063 申请日期 1997.05.29
申请人 TOSHIBA CORP 发明人 FUKUDA MASATOSHI
分类号 H01L23/12;(IPC1-7):H01L23/12 主分类号 H01L23/12
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