| 摘要 |
PROBLEM TO BE SOLVED: To reduce the trial evaluation equipment and apparatus for testing the function of an alternative IC and the labor required for evaluation significantly by comparing the output from an IC of disused type with that from the alternative IC based on the information of the electrical characteristics or the pin function of the IC of disused type. SOLUTION: Upon occurrence of an IC of disused type, the information on the electrical characteristics or the pin function thereof is inputted from a panel section 10 and stored in a memory section 20. Based on that information, a test control section 50 generates a test pattern which is then inputted to a socket part 30 to be tested inserted with the IC of disused type and a test socket part 40 inserted with the alternative IC. A comparing section 60 compares the output from the IC of disused type with that from the alternative IC for the inputted test pattern and delivers the results to a monitor section. A decision can be made easily whether the alternative IC is suitable as an alternative to the IC of disused type based on the comparison results. |
