| 摘要 |
A method for insulating semiconductor elements is disclosed. The method includes steps of: forming a 3-layer semiconductor substrate consisting of an upper conductive layer, a high concentration impurity layer, and a lower conductive layer; carrying out a photo etching to remove the upper conductive layer, thereby opening the high concentration impurity layer; dipping the semiconductor substrate into an aqueous HF solution of a certain ratio, and carrying out an anodizing reaction to convert the high concentration impurity layer into a porous silicon layer; and carrying out a wet oxidation to convert the porous silicon layer into a buried oxide layer.
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