发明名称 Repairable wafer scale integration system
摘要 An apparatus for integrating wafer scale semiconductor integrated circuits and interfacing them with other systems. A wafer, partial wafer, die or plurality of same are mated to a printed circuit board (PCB) which electrically contacts the pads on each die using small conductive pillars. The PCB in turn is connected easily to other electronic systems. The entire apparatus is incorporated into other systems which utilize the dice in the apparatus. The apparatus may be fitted with heating elements and cooling channels to generate the necessary dice temperatures for burn-in, testing, and operation. The apparatus is easily adaptable to include more dice in a stacked configuration.
申请公布号 US5682064(A) 申请公布日期 1997.10.28
申请号 US19950611602 申请日期 1995.01.23
申请人 MICRON TECHNOLOGY, INC. 发明人 ATKINS, GLEN G.;COHEN, MICHAEL S.;MAURITZ, KARL H.;SHAFFER, JAMES M.
分类号 G01R1/073;G01R31/28;H01L21/66;H01L21/98;H01L23/32;H01L23/34;H01L25/065;(IPC1-7):H01L23/053;H01L23/12 主分类号 G01R1/073
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