发明名称 DEVICE AND METHOD FOR DETECTING AND EVALUATING DOT PATTERN
摘要 PROBLEM TO BE SOLVED: To surely analyze a dot pattern and sort the pattern even when there are many dots like a fault pattern on a semiconductor memory chip. SOLUTION: Coordinate counters SZ1 to SZ1024, ZZ1 to ZZ256 to respective coordinate values of coordinate axes are determined from the data of a dot pattern stored with a computer, the values of the counters SZ1 to SZ1024, ZZ1 to ZZ256 are formed from the detected number of dots and an input vector having a component formed from the counters SZ1 to SZ1024, ZZ1 to ZZ256 is inputted to a corresponding neuron circuit network. Thereby the neuron circuit network calcuates an output vector by comparing the input vector with a set vector based upon an example dot pattern and outputs the sort value of the dot pattern by the use of the found output vector.
申请公布号 JPH09270012(A) 申请公布日期 1997.10.14
申请号 JP19960355984 申请日期 1996.12.25
申请人 SIEMENS AG 发明人 PEETAA FUEDERURU
分类号 G01R31/28;G01R13/20;G01R31/319;G06F11/22;G06F15/18;G06N3/00;G06T1/00;G06T7/00;G11C29/00;G11C29/40;G11C29/56;H01L21/66 主分类号 G01R31/28
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