摘要 |
<p>Improved multilayer matrix line (34) including inverted gate thin film matrix transistors (46) to reduce defects in and enhance performance of matrix devices incorporating the transistors, including active matrix displays (10). The inverted gate line is formed in a multilayer metal structure deposited sequentially before patterning of a first bottom refractory layer (124), an aluminum layer (126) and a second refractory layer (128) for the gate structure. The aluminum layer is anodized adjacent the gate to prevent step coverage problems. A further improvement is provided when forming an active matrix display storage capacitor (50) utilizing the multilayer gate structure.</p> |