| 摘要 |
An instrument probe contains an improved camera and light source arrangement which; and is positioned behind the camera for providing indirect illumination of the passage being inspected by the camera such as the contents of the bore hole or its casings. The light source is physically separated from the camera thus providing insulation to the camera from heat produced by the light source. The camera housing comprises a quick connect and disconnect latch which allows for the swift changeover of camera components at the distal end of the instrument probe. A parabolic reflector at the light source directs light distally to the instrument body. A second reflector is located on the camera body to further reflect light towards the walls of the passageways, thereby enhancing the indirect light funneled to the area being inspected by the camera.
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