发明名称 |
CALIBRATION UNIT FOR OUTLINE OF SEMICONDUCTOR PACKAGE |
摘要 |
PROBLEM TO BE SOLVED: To correctly calibrate a semiconductor package, by providing a plurality of leg parts which are integrally formed in a single body of a rectangular block while spaced a distance unrelated to any specific semiconductor device. SOLUTION: A calibration unit 11 is a rectangular metallic block of a single body having some mechanically worked leg parts 12 in the periphery. The leg parts 12 extend outside from calibration side faces representing surface of semiconductor devices and are separated a distance unrelated to any specific semiconductor device. An actual time reference device 9 is located 50mm closer to a camera 50 than leads ion the unit 11 when the unit 11 is loaded onto a mounting plate 8. An image system scans the reference device 9, confirming a position of an opening 9a. The position if the opening 9a can be confirmed by searching for a position where white is changed to block in an image. The mounting plate 8 can rotate. Side faces 8a-8b rotate to an image path of the camera, so that one of the side faces of the unit 11 is directed to the camera. |
申请公布号 |
JPH09203624(A) |
申请公布日期 |
1997.08.05 |
申请号 |
JP19960346081 |
申请日期 |
1996.12.25 |
申请人 |
TEXAS INSTR INC (TI) |
发明人 |
DEBITSUDO EE SUKURAMUSUTETSUDO;KURAIDO EMU GESUTO ZA SAADO;DENISU EMU BOTOKIN |
分类号 |
G01B11/24;G01N21/88;G01N21/93;G01N21/956;H01L21/66;H01L23/50;H01L23/544;H05K13/08 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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