发明名称 CALIBRATION UNIT FOR OUTLINE OF SEMICONDUCTOR PACKAGE
摘要 PROBLEM TO BE SOLVED: To correctly calibrate a semiconductor package, by providing a plurality of leg parts which are integrally formed in a single body of a rectangular block while spaced a distance unrelated to any specific semiconductor device. SOLUTION: A calibration unit 11 is a rectangular metallic block of a single body having some mechanically worked leg parts 12 in the periphery. The leg parts 12 extend outside from calibration side faces representing surface of semiconductor devices and are separated a distance unrelated to any specific semiconductor device. An actual time reference device 9 is located 50mm closer to a camera 50 than leads ion the unit 11 when the unit 11 is loaded onto a mounting plate 8. An image system scans the reference device 9, confirming a position of an opening 9a. The position if the opening 9a can be confirmed by searching for a position where white is changed to block in an image. The mounting plate 8 can rotate. Side faces 8a-8b rotate to an image path of the camera, so that one of the side faces of the unit 11 is directed to the camera.
申请公布号 JPH09203624(A) 申请公布日期 1997.08.05
申请号 JP19960346081 申请日期 1996.12.25
申请人 TEXAS INSTR INC (TI) 发明人 DEBITSUDO EE SUKURAMUSUTETSUDO;KURAIDO EMU GESUTO ZA SAADO;DENISU EMU BOTOKIN
分类号 G01B11/24;G01N21/88;G01N21/93;G01N21/956;H01L21/66;H01L23/50;H01L23/544;H05K13/08 主分类号 G01B11/24
代理机构 代理人
主权项
地址