发明名称 X=ray examination or diagnostic device with two adjustable apertures
摘要 The device has an x-ray emitter (1) to generate an x-ray beam bundle which passes through a first aperture arrangement with adjustable aperture plates (10) to an examination region. After passing through a second aperture arrangement (20) with adjustable plates (21,23) the beam bundle is incident on a unit (5) to display an x-ray recording. The aperture plates of at least one of the two aperture arrangements (10,20) are provided with markings (25). These are shown in the x-ray recording at least when the radiation field from the first aperture arrangement (10) deviates from that of the second (20).
申请公布号 DE19539602(A1) 申请公布日期 1997.04.30
申请号 DE19951039602 申请日期 1995.10.25
申请人 PHILIPS PATENTVERWALTUNG GMBH, 22335 HAMBURG, DE 发明人 SENGELMANN, PETER, 22844 NORDERSTEDT, DE
分类号 A61B6/06;(IPC1-7):G03B42/02;G01N23/04 主分类号 A61B6/06
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