发明名称 |
X=ray examination or diagnostic device with two adjustable apertures |
摘要 |
The device has an x-ray emitter (1) to generate an x-ray beam bundle which passes through a first aperture arrangement with adjustable aperture plates (10) to an examination region. After passing through a second aperture arrangement (20) with adjustable plates (21,23) the beam bundle is incident on a unit (5) to display an x-ray recording. The aperture plates of at least one of the two aperture arrangements (10,20) are provided with markings (25). These are shown in the x-ray recording at least when the radiation field from the first aperture arrangement (10) deviates from that of the second (20).
|
申请公布号 |
DE19539602(A1) |
申请公布日期 |
1997.04.30 |
申请号 |
DE19951039602 |
申请日期 |
1995.10.25 |
申请人 |
PHILIPS PATENTVERWALTUNG GMBH, 22335 HAMBURG, DE |
发明人 |
SENGELMANN, PETER, 22844 NORDERSTEDT, DE |
分类号 |
A61B6/06;(IPC1-7):G03B42/02;G01N23/04 |
主分类号 |
A61B6/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|