| 摘要 |
PROBLEM TO BE SOLVED: To supply a signal to a LSI internal circuit at the same timing as logic simulation by stopping an optional clock pulse in a plurality of test clocks, and performing the crossing-over of the clock of a signal. SOLUTION: A LSI tester can freely stop and move each clock A, B. The clock A is given from a point P1 to a latch circuit 1 through a buffer 5, and the circuit 1 latches an input signal synchronously with the signal build up at a time T1 in a point P1. The signal is inputted to a latch circuit 2 at the time T1 through the element delay and wiring delay of the circuit 1. The clock pulse CP1 corresponding to the clock B is stopped by the LS1 tester make the circuit 2 latch the signal synchronously with the build up of the following pulse at a time T13. The circuit 2 transmits the signal to an internal circuit L at the timing of a time T14 through element delay and wiring delay. The circuit L transmits the operation result based on the signal to an output pin, and forms the same output expected value as in the case having no delay difference τ. |
