| 摘要 |
PROBLEM TO BE SOLVED: To obtain an IC test system which can efficiently operate IC tester. SOLUTION: In an IC test station which is made up of a handler 11 to convey ICs and an IC tester body 10 to test the operation of the ICs conveyed by the handler 11 to be connected to a test head, the handlers 11 transfer the ICs tested to a universal tray from a test tray without sorting those accepted from those rejected and the results of testing the ICs are stored into a stored information memory means 14. The information stored in the stored information memory means 14 is fed to an exclusive sorting device 13 and the sorting is performed by the exclusive sorting device 13. |
